Master of Science in Computer Science: Faculty

Our Program Chair

Steven J. Gold, Ph.D.

Education:

  • Ph.D. Philosophy – University of California, Santa Barbara (UCSB)
  • M.A. Philosophy (with Specialty in Law) – University of California, Santa Barbara (UCSB)
  • B.A. Political Science & History – University of California, Los Angeles (UCLA)

Research & Teaching Interests: Specializes in philosophy and organizational studies, disability theory, information technology, and ethics, law, and public policy.

Publications:

  • Gold, S. J. (2017). Birth of the pain clinic: Governmentality, identity and chronic pain. In E. Pezet & A. McKinlay (Eds.), Foucault, governmentality and management: Rethinking the management of populations, individuals and organizations (pp. 135-156). Routledge.
  • Balicki, R., & Gold, S. (2015). Jeet Kune Do: The principles of a complete fighter (2nd ed.). H&L Press.
  • Zacher, H., McKenna, B., Rooney, D., & Gold, S. (2015). Wisdom in the military context. Military Psychology, 27(3), 142-154. https://doi.org/10.1037/mil0000070

 

 

Master of Science in Computer Science: Faculty

Ted Sun - MSCS Faculty

Ted Sun, Ph.D.

Faculty

Education

• Ph.D. in Electrical Engineering – Santa Clara University
• M.S. in Management Science – University of Dayton
• B.S. in Atmospheric Physics – National Central University

Research & Training

Teaching interests include data science, machine learning, decision science, data visualization, technology innovation & product management, artificial intelligence (AI), operational research, optimization, probability and statistics, elementary computer programming. Research interests include the automation of multiple steps in any field including manufacturing, design, or debug by using diversified programming languages, using the statistical method to predict the business or IC chip failure probability by considering major internal and external factors.

Publications

• Ted Sun, Ayhan Mutlu, and Mahamad Rahman, “A New Statistical Methodology Predicting Chip Failure Probability Considering Electromigration,” Microelectronics Reliability Volume 53, Issue 12, Pages 1979– 1986, December 2013.

• Ted Sun, Ayhan Mutlu, and Mahamad Rahman, “Statistical Electromigration Analysis of a Chip with the Consideration of a Within-Die Temperature Map,” Session C2L-B, IEEE ISCAS, Beijing, May 19-23, 2013.

• Ted Sun, Ayhan Mutlu, and Mahamad Rahman, “A New Statistical Electromigration Analysis Methodology that Incorporates Across-Chip Temperature Variation,” Proc. 3rd ASQED Symposium, 2011, Kuala Lumpur, July 19-20, 2011.

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